FY511: Nanostructure characterisation (5 ECTS)

STADS: 07001101

Level
Bachelor course

Teaching period
The course is offered in the spring semester.
3 rd quarter.

Teacher responsible
Email: kloesgen@memphys.sdu.dk

Timetable
Group Type Day Time Classroom Weeks Comment
Common I Monday 12-14 U17 07-11
Common I Wednesday 10-12 U26 07-09, 11
Common I Wednesday 14-16 U48 10
S1 TE Tuesday 14-16 U14 07-11
S1 TE Thursday 10-12 U14 07-09, 11
S1 TE Friday 08-10 U26 10
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Prerequisites:
None

Academic preconditions:
Students must have followed the first year’s courses in the nanobioscience curriculum, or the courses of the science year (for students who take this course as a supplement to the science curriculum).

Course introduction
In this course the students learn how structures can be formally described and they get acquainted with some of the currently most important experimental techniques available for nanostructure characterization. The course is not a hands-on experimental course, but it will include demonstrations of laboratory equipment available at SDU and via the Internet, as part of the instruction.

Expected learning outcome
By the end of the course the students will be able to

• distinguish between ordered and non-ordered structures
• describe order using crystallographic terms and other physical parameters
• give the physical background that is required to measure nanostructures
• explain the experimental principles applied for the characterisation of nano-structures
• apply scientific sources to deepen their competences regarding special methods
• write a report in the same format as a scientific article on the application of a method for structure characterisation.

Subject overview
Nanostructures in physical, chemical and biological systems:

1. Optical techniques resolving down to about 40 nm: SNOM, FCS, and confocal microscopy, including the use of quantum dot materials as markers
2. Electron microscopy with resolution capabilities of at least 1,5 nm (TEM, SEM, STEM) with additional techniques for composition analysis and contrast
3. Raster-probe methods (AFM, STM, SNOM)
4. Scattering techniques (neutrons, electrons, X-rays and light)

(Abbreviations: TEM-transmission electron microscopy; SEM-scanning electron; STEM-raster transmission-elektronmikroskopi; SNOM-raster nærfelts-optisk mikroskopi; FCS-fluorescens-korrelations- spektroskopi; AFM-atomar kraft-mikroskopi; STM- raster tunnel-mikroskopi).

Literature
  • Walker: Physics, 3rd Ed., 2007, Pearson International Edition.
  • Horst-Günther Rubahn (oversat og bearbejdet af Per Morgen): Nanoteknologi, Gyldendal, 2007.
  • Noter fra forelæsningerne.


Website
This course uses e-learn (blackboard).

Prerequisites for participating in the exam
None

Assessment and marking:
Oral examination with internal examination and marks according to the Danish 7-scale.

Expected working hours
The teaching method is based on three phase model.

20 forelæsninger, 20 eksaminatorietimer/opgaveregning, 10 timer projektarbejde.
Educational activities

Language
This course is taught in English.

Course enrollment
See deadline of enrolment.

Tuition fees for single courses
See fees for single courses.