FY511: Nanostructure characterisation (5 ECTS)

STADS: 07003201

Level
Bachelor course

Teaching period
The course is offered in the spring semester.
3 rd quarter.

Teacher responsible
Email: kloesgen@ifk.sdu.dk

Timetable
Show entire timetable
Show personal time table for this course.

Prerequisites:
None

Academic preconditions:
Students must have followed the first year’s courses in the nanobioscience curriculum, or the courses of the science year (for students who take this course as a supplement to the science curriculum).

Course introduction
In this course the students learn how structures can be formally described and they get acquainted with some of the currently most important experimental techniques available for nanostructure characterization. The course is not a hands-on experimental course. Lectures are accompanied by exercises dealing with structure determination. They make use of original data analysis for selected examples. The course will also include demonstrations of laboratory equipment available at SDU and will use, as part of the instruction, material available on the Internet.

Expected learning outcome
By the end of the course the students will be able to

• distinguish between ordered and non-ordered structures
• describe order using crystallographic terms and other physical parameters
• give the physical background that is required to measure and describe nanostructures
• explain the experimental principles applied for the characterisation of nano-structures
• apply scientific sources to deepen their competences regarding special methods
• write a report in the same format as a scientific article on the application of a method for structure characterisation.

Subject overview
Nanostructures in physical, chemical and biological systems:

1. Optical techniques resolving down to about 40 nm: SNOM, FCS, and confocal microscopy, including the use of quantum dot materials as markers
2. Electron microscopy with resolution capabilities of at least 1,5 nm (TEM, SEM, STEM) with additional techniques for composition analysis and contrast
3. Raster-probe methods (AFM, STM, SNOM)
4. Scattering techniques (neutrons, electrons, X-rays and light)

(Abbreviations: TEM-transmission electron microscopy; SEM-scanning electron; STEM-raster transmission-elektronmikroskopi; SNOM-raster nærfelts-optisk mikroskopi; FCS-fluorescens-korrelations- spektroskopi; AFM-atomar kraft-mikroskopi; STM- raster tunnel-mikroskopi).

Literature

• Walker: Physics,, 3rd Ed., 2007, Pearson International Edition.
• Horst-Günther Rubahn (oversat og bearbejdet af Per Morgen): Nanoteknologi, Gyldendal, 2007. .
• Noter fra forelæsningerne.

Website
This course uses e-learn (blackboard).

Prerequisites for participating in the exam
None

Assessment and marking:
Oral examination with internal examination and marks according to the Danish 7-scale.

The project work consists of a short article about a structure method. The topic will be chosen by the student in agreement with the teacher.
The text must be accepted before the oral exam.

Reexam after 4th quater

Expected working hours
The teaching method is based on three phase model.

20 forelæsninger, 20 eksaminatorietimer/opgaveregning, 10 timer projektarbejde.
Educational activities

Language
This course is taught in English.

Course enrollment
See deadline of enrolment.

Tuition fees for single courses
See fees for single courses.